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Carrier mobility in inversion layers and rf plasma induced radiation defects at the Si-SiO2 interface : J. Kassabov, E. Atanassova and E. Goranova. Solid-St. Electron.27(1), 13 (1984)


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
127 KB
Volume
24
Category
Article
ISSN
0026-2714

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