๐”– Bobbio Scriptorium
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Carrier lifetime measurements on electron-irradiated silicon crystals

โœ Scribed by Graff, K. ;Pieper, H.


Publisher
John Wiley and Sons
Year
1975
Tongue
English
Weight
451 KB
Volume
30
Category
Article
ISSN
0031-8965

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## Abstract An overview is given on recent developments at Fraunhofer ISE in the field of diagnostic techniques based on carrier lifetime measurements. The status of the different lifetime spectroscopy methods and the diagnostic capabilities of infrared carrier lifetime imaging are outlined. A comb