Carrier fluctuation noise in a MOSFET channel due to traps in the oxide : R. P. Jindal and A. Van Der Ziel. Solid-St. Electron. 21, 901 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 124 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90298-6