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Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

✍ Scribed by Tiwald, Thomas E.; Woollam, John A.; Zollner, Stefan; Christiansen, Jim; Gregory, R. B.; Wetteroth, T.; Wilson, S. R.; Powell, Adrian R.


Book ID
120866698
Publisher
The American Physical Society
Year
1999
Tongue
English
Weight
581 KB
Volume
60
Category
Article
ISSN
1098-0121

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