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Carrier and mobility profile measurements in n-type ion-implanted GaAs by the differential sheet resistivity and Hall effect technique

✍ Scribed by R. Nipoti; D. Pocci; A. Cetronio; C. Lanzieri


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
336 KB
Volume
50
Category
Article
ISSN
0169-4332

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