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Carbon Nanotubes Anchored to Silicon for Device Fabrication

โœ Scribed by Kristina T. Constantopoulos; Cameron J. Shearer; Amanda V. Ellis; Nicolas H. Voelcker; Joseph G. Shapter


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
800 KB
Volume
22
Category
Article
ISSN
0935-9648

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A simple and reliable welding method was developed to fabricate carbon nanotube probe used in atomic force microscopy here. First, apply less than 20 V voltage between silicon probe and carbon nanotube when they were in close proximity under direct view of optical microscope. Then, let carbon nanotu