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Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors

โœ Scribed by Nguyen, Cattien V; Chao, Kuo-Jen; Stevens, Ramsey M D; Delzeit, Lance; Cassell, Alan; Han, Jie; Meyyappan, M

Book ID
125861457
Publisher
Institute of Physics
Year
2001
Tongue
English
Weight
228 KB
Volume
12
Category
Article
ISSN
0957-4484

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โœ Shimizu, Kenichi; Mitani, Tomoaki ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Springer Berlin Heidelberg ๐ŸŒ English โš– 272 KB

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize