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Capacitance–voltage characteristics of Pt/Bi2VO5.5/p-Si structures

✍ Scribed by Zhenlun Zhang; Hongmei Deng; Pingxiong Yang

Publisher
Springer US
Year
2010
Tongue
English
Weight
334 KB
Volume
22
Category
Article
ISSN
0957-4522

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✍ K. V. R. Prasad; K. B. R. Varma 📂 Article 📅 1995 🏛 Springer 🌐 English ⚖ 406 KB

The X-ray powder diffraction, dielectric and thermal studies of bismuth vanadate (Bi2VOs.s) ceramic have been carried but as a function of temperature (300-900 K). The hightemperature X-ray studies, supported by differential scanning calorimetry, clearly demonstrate that Bi2VOs.~ undergoes two major