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Capacitances in silicon microstrip detectors

✍ Scribed by E. Barberis; N. Cartiglia; C. LeVier; J. Rahn; P. Rinaldi; H.F.-W. Sadrozinski; R. Wichmann; T. Ohsugi; Y. Unno; H. Miyata; N. Tamura; K. Yamamoto

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 624 KB
Volume: 342
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(94)91414-1

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