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Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors

✍ Scribed by J.P. Kleider

Book ID: 108388548
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 175 KB
Volume: 427
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(02)01158-6

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