Capacitance Measurements of Two-Dimensional and Three-Dimensional IC Interconnect Structures by Quasi-Static – Technique

✍ Scribed by Stucchi, M.; Velenis, D.; Katti, G.

• Book ID: 114632371
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 891 KB
• Volume: 61
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2011.2179829