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Capacitance and conductance characterization of ferrocene-containing self-assembled monolayers on silicon surfaces for memory applications

✍ Scribed by Li, Qiliang; Mathur, Guru; Homsi, Mais; Surthi, Shyam; Misra, Veena; Malinovskii, Vladimir; Schweikart, Karl-Heinz; Yu, Lianhe; Lindsey, Jonathan S.; Liu, Zhiming; Dabke, Rajeev B.; Yasseri, Amir; Bocian, David F.; Kuhr, Werner G.

Book ID: 127341058
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 271 KB
Volume: 81
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1500781

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