Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

• Book ID: 119807254
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 37 KB
• Volume: 23
• Category: Article
• ISSN: 0740-7475
• DOI: 10.1109/mdt.2006.89