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Calibration studies for quantitative x-ray photoelectron spectroscopy of ions

✍ Scribed by Bancroft, G. Michael.; Brown, James R.; Fyfe, W. S.


Book ID
126240973
Publisher
American Chemical Society
Year
1977
Tongue
English
Weight
586 KB
Volume
49
Category
Article
ISSN
0003-2700

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The effects of photoelectron diffraction
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## Abstract Although not discussed in most reviews of quantitative x‐ray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements