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Calibration of step heights and roughness measurements with atomic force microscopes

✍ Scribed by J Garnaes; N Kofod; A Kühle; C Nielsen; K Dirscherl; L Blunt

Book ID: 108400592
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 241 KB
Volume: 27
Category: Article
ISSN: 0141-6359
DOI: 10.1016/s0141-6359(02)00184-8

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