✦ LIBER ✦
Calibration of sputtering yields for AES depth profiling of oxide layers on aluminium by means of carrier-gas heat extraction analysis
✍ Scribed by T. F. Chen; R. P. H. Garten; E. Grallath; H. Bubert; H. Jenett
- Book ID
- 112323438
- Publisher
- Springer
- Year
- 1987
- Tongue
- English
- Weight
- 973 KB
- Volume
- 329
- Category
- Article
- ISSN
- 1618-2650
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