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Calibration of Multiport Reflectometers by Means of Four Open/Short Circuits

✍ Scribed by Shihe Li; Bosisio, R.G.


Book ID
114657991
Publisher
IEEE
Year
1982
Tongue
English
Weight
612 KB
Volume
30
Category
Article
ISSN
0018-9480

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## Abstract A novel numerical de‐embedding scheme called the short‐open calibration (SOC) technique, in conjunction with the vector finite element method (FEM), has been developed to characterize two‐port network of arbitrarily shaped, three‐dimensional discontinuities in microwave circuits. This S