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Calibration and X-ray spectroscopy with silicon CCDs

✍ Scribed by David H. Lumb

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 624 KB
Volume: 290
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(90)90576-r

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