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Calculation of the Intensity of the Small-Angle X-Ray Scattering by Small Clusters of Intrinsic Point Defects

✍ Scribed by W. Kienle; W. Frank

Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
580 KB
Volume
124
Category
Article
ISSN
0370-1972

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✦ Synopsis

Abstract

The small‐angle X‐ray intensity scattered by small platelet‐shaped agglomerates of vacancy or self‐interstitial type is calculated in two ways: within the framework of continuum theory or by a discrete‐lattice model. Both the methods take into account that small clusters are not fully relaxed. A comparison of the numerical results of the two methods is presented for copper. It is found that both the methods lead to results which considerably deviate from those obtained for completely relaxed clusters.

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