✦ LIBER ✦
Calculation of the gate current due to injection of hot electrons into the subgate oxide of a submicrometer mos field-effect transistor
✍ Scribed by V. M. Borzdov; N. P. Boreiko; V. O. Galenchik; O. G. Zhevnyak; F. F. Komarov
- Book ID
- 110623472
- Publisher
- Springer US
- Year
- 1998
- Tongue
- English
- Weight
- 253 KB
- Volume
- 71
- Category
- Article
- ISSN
- 1573-871X
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