Calculation of the breakdown characteristics of bipolar transistors using a two-dimensional model : Hans-Martin Rein. Solid State Electronics19, 145 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 123 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90296-1