Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm

✍ Scribed by Guanghui Liu; Ming Zhou; Guohang Hu; Xiaofeng Liu; Yunxia Jin; Hongbo He; Zhengxiu Fan

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 919 KB
• Volume: 256
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2010.02.003