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Calculation of surface recombination current in bipolar microelectronic structures subjected to ionizing radiation

✍ Scribed by V. S. Pershenkov; D. V. Savchenkov; A. S. Bakerenkov; A. S. Egorov

Book ID: 110214377
Publisher: Springer
Year: 2009
Tongue: English
Weight: 238 KB
Volume: 38
Category: Article
ISSN: 1063-7397
DOI: 10.1134/s106373970901003x

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