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Calculation of magnetostatic field around far side defects for nondestructive testing

✍ Scribed by Patel, U.; Rodger, D.

Book ID: 114548542
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 329 KB
Volume: 31
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.376477

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