Calculation of diffraction line profiles in the case of coupled stacking fault and size-effect broadening: application to boehmite AlOOH

✍ Scribed by Grebille, D. ;Bérar, J. F.

• Book ID: 114499868
• Publisher: International Union of Crystallography
• Year: 1986
• Tongue: English
• Weight: 603 KB
• Volume: 19
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889886089483