Calculating the failure frequency of a repairable system : Huang Xi Zhi. Microelectron. Reliab.22 (5), 945 (1982)

• Book ID: 103277653
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 129 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90828-4