Caesium sputter ion source compatible with commercial SIMS instruments

✍ Scribed by S.F. Belykh; V.V. Palitsin; I.V. Veryovkin; A.P. Kovarsky; R.J.H. Chang; A. Adriaens; M. Dowsett; F. Adams

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 171 KB
• Volume: 252
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2006.02.172