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c-Axis correlated extended defects and critical current in YBa2Cu3Ox films grown on Au and Ag-nano dot decorated substrates

✍ Scribed by P. Mikheenko; A. Sarkar; V.-S. Dang; J.L. Tanner; J.S. Abell; A. Crisan


Book ID
104083957
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
792 KB
Volume
469
Category
Article
ISSN
0921-4534

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