✦ LIBER ✦
Burn-in and thermal cyclic tests to determine the short-term reliability of a thin film resistance temperature detector
✍ Scribed by Julian W. Post; A. Bhattacharyya
- Book ID
- 116748869
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 1011 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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