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Bulk trapping effect on carrier diffusion length as determined by the surface photovoltage method: Theory : S. C. Choo and A. C. Sanderson, Solid-St. Electron. 13 (1970), p. 609


Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
208 KB
Volume
9
Category
Article
ISSN
0026-2714

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