Bulk trapping effect on carrier diffusion length as determined by the surface photovoltage method: Theory : S. C. Choo and A. C. Sanderson, Solid-St. Electron. 13 (1970), p. 609

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 208 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90206-4