Bulk electromigration reliability tests of large-grained aluminum lines with regard to semiconductor contacts : H.-U. Schreiber. Solid-St. Electron.29(9), 893 (1986)

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 92 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90027-8