✦ LIBER ✦

Bulk defect induced low-frequency noise in n+-p silicon diodes

✍ Scribed by Fan-Chi Hou; Bosman, G.; Simoen, E.; Vanhellemont, J.; Claeys, C.

Book ID: 114537505
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 362 KB
Volume: 45
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.735731

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