✦ LIBER ✦
Bulk and metastable defects in CuIn1-xGaxSe2 thin films using drive-level capacitance profiling
✍ Scribed by Heath, Jennifer T.; Cohen, J. David; Shafarman, William N.
- Book ID
- 111856859
- Publisher
- American Institute of Physics
- Year
- 2004
- Tongue
- English
- Weight
- 409 KB
- Volume
- 95
- Category
- Article
- ISSN
- 0021-8979
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