✦ LIBER ✦
Built-in self testing of embedded memories: Jain, S K and Stroud, C EIEEE Des. Test Comput. Vol 3 No 5 (October 1986) pp 27–37
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 103 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0141-9331
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