Built-in-Self-Test of FPGAs With Provable Diagnosabilities and High Diagnostic Coverage With Application to Online Testing

✍ Scribed by Dutt, S.; Verma, V.; Suthar, V.

• Book ID: 117907946
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 847 KB
• Volume: 27
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2007.906992