Building a rule-based machine-vision system for defect inspection on apple sorting and packing lines

A vision and robot based on-line inspect

A vision and robot based on-line inspection monitoring system for electronic manufacturing

✍ Immanuel Edinbarough; Roberto Balderas; Subhash Bose 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 478 KB

This paper presents a neural network-based vision inspection system interfaced with a robot to detect and report IC lead defects on-line. The vision system consists of custom software that contains a neural network database for each of the ICs to be inspected on a PCB. The vision system uses gray sc