Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation

✍ Scribed by Liu, Yan; Chen, Linfeng; Tan, C. Y.; Liu, H. J.; Ong, C. K.

• Book ID: 119944606
• Publisher: American Institute of Physics
• Year: 2005
• Tongue: English
• Weight: 649 KB
• Volume: 76
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.1935429