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Broad-Band Noise Mechanisms and Noise Measurements of Metal Semiconductor Junctions

✍ Scribed by Jelenski, A.; Kollberg, E.L.; Zirath, H.H.G.


Book ID
114659163
Publisher
IEEE
Year
1986
Tongue
English
Weight
996 KB
Volume
34
Category
Article
ISSN
0018-9480

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