Breakdown voltage reduction of high voltage PIN diodes by a process induced linear defect

✍ Scribed by Korde, R. S. ;Tyagi, M. S.

• Book ID: 105375335
• Publisher: John Wiley and Sons
• Year: 1981
• Tongue: English
• Weight: 563 KB
• Volume: 64
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210640248