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Breakdown properties of thin oxides in irradiated MOS capacitors

✍ Scribed by T. Brozek; B. Pešić; A. Jakubowski; N. Stojadinović

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 533 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90271-y

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