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Breakdown probabilities for thin heterostructure avalanche photodiodes

✍ Scribed by Hayat, M.M.; Sakoglu, U.; Oh-Hyun Kwon; Shuling Wang; Campbell, J.C.; Saleh, B.E.A.; Teich, M.C.

Book ID: 117882420
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 416 KB
Volume: 39
Category: Article
ISSN: 0018-9197
DOI: 10.1109/jqe.2002.806217

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