✦ LIBER ✦
Breakdown mechanisms in ultra-thin oxides: impact of carrier energy and current through substrate hot carrier stress study
✍ Scribed by G Ribes; S Bruyère; M Denais; F Monsieur; V Huard; D Roy; G Ghibaudo
- Book ID
- 108207324
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 241 KB
- Volume
- 72
- Category
- Article
- ISSN
- 0167-9317
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