✦ LIBER ✦
Breakdown kinetics at nanometer scale of innovative MOS devices by conductive atomic force microscopy
✍ Scribed by Patrick Fiorenza; Raffaella Lo Nigro; Vito Raineri; Dario Salinas
- Book ID
- 104051586
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 216 KB
- Volume
- 84
- Category
- Article
- ISSN
- 0167-9317
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