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Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates

✍ Scribed by Entin, I. R. ;Khrupa, V. I. ;Datsenko, L. I.


Book ID
114500364
Publisher
International Union of Crystallography
Year
1990
Tongue
English
Weight
440 KB
Volume
23
Category
Article
ISSN
0021-8898

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