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Boundary element methods for 3D capacitance and substrate resistance calculations in inhomogeneous media in a VLSI layout verification package

✍ Scribed by T. Smedes; N.P. van der Meijs; A.J. van Genderen


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
733 KB
Volume
20
Category
Article
ISSN
0965-9978

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