✦ LIBER ✦
Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter
✍ Scribed by Saxena, Nitin; Seshadhri, C.
- Book ID
- 118158320
- Publisher
- Society for Industrial and Applied Mathematics
- Year
- 2012
- Tongue
- English
- Weight
- 242 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0097-5397
- DOI
- 10.1137/10848232
No coin nor oath required. For personal study only.