Bitter pattern study of flux pinning in melt-grown YBa2Cu3O7-x
β Scribed by Nae-Lih Wu; Hsi-Her Zheng; Kwo-Lon Tarn
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 875 KB
- Volume
- 233
- Category
- Article
- ISSN
- 0921-4534
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π SIMILAR VOLUMES
The critical current and flux pinning properties of melt grown YBa2Cu3OT\_6 bulk material were investigated by transport measurements and V-I characteristics. A JΒ’ of 16 000 A cm -2 in zero field and 3000 A cm -2 in 1 T at 77 K was obtained using a criterion of 3.3 I~V cm-~. No features of granulari
Thin films of YBazCuaO+x are deposited on MgO substrates via dc magnetron sputter technic. The thicknesses varry between 1Onm and 500nm. The films are patterned by dry etching method. Narrow stripes with widths down to 1 urn are obtained without serious degradation, e.g. Tc,ocf > 85K and Tc < 1.6K.
The intragranular critical current density JΒ’, the apparent pinning potential U0, and the irreversibility temperature Ti~ of meltgrown (MG), quench-melt-grown (QMG), and sintered YBa2Cu306Γ·y (123) were studied. A systematic increase in Uo and a slower drop in Jc with temperature and magnetic field h