Bit-number cumulants as a correlation measure of self-generated oscillations in a semiconductor model for low-temperature impurity breakdown

✍ Scribed by H. Naber; E. Schöll

• Book ID: 112512942
• Publisher: Springer
• Year: 1990
• Tongue: English
• Weight: 206 KB
• Volume: 78
• Category: Article
• ISSN: 1434-6036
• DOI: 10.1007/bf01307850