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Bistatic multiple scattering from randomly rough surfaces

✍ Scribed by Hsieh, C.-Y.; Fung, A.K.

Book ID: 114455274
Publisher: The Institution of Electrical Engineers
Year: 2003
Tongue: English
Weight: 274 KB
Volume: 150
Category: Article
ISSN: 1350-2417
DOI: 10.1049/ip-map:20030717

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