Germanium on sapphire (GeOS) is proposed for system on a chip applications. Sapphire substrates are demonstrated to exhibit lower rf losses and superior crosstalk suppression compared with oxidised silicon handle wafers. Inductors on sapphire also show higher quality factor and better frequency resp
BIST for systems-on-a-chip
โ Scribed by Hans-Joachim Wunderlich
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 740 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0167-9260
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โฆ Synopsis
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-providers offer RISC-kernels, embedded memories, DSPs, and many other functions, and built-in self-test is the appropriate method for testing complex systems composed of different cores. In this paper, we overview BIST methods for different types of cores and present advanced BIST solutions. Special emphasis is put on deterministic BIST methods as they do not require any modifications of the core under test and help to protect intellectual property (IP).
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